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[IEEE 2016 16th European Conference on Radiation and its Effects on Components and Systems (RADECS) - Bremen (2016.9.19-2016.9.23)] 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Register file criticality on embedded microprocessor reliability
Lins, Filipe M., Tambara, Lucas, Kastensmidt, Fernanda L., Rech, PaoloYear:
2016
Language:
english
DOI:
10.1109/RADECS.2016.8093143
File:
PDF, 361 KB
english, 2016