Experimental Time Evolution Study of the HfO 2 -Based IMPLY Gate Operation
Maestro-Izquierdo, Marcos, Martin-Martinez, Javier, Yepes, Albert Crespo, Escudero, Manel, Rodriguez, Rosana, Nafria, Montserrat, Aymerich, Xavier, Rubio, AntonioVolume:
65
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2017.2778315
Date:
February, 2018
File:
PDF, 1.45 MB
english, 2018