Impact of High-Temperature Storage Stressing (HTSS) on...

IEEE Transactions on Power Electronics 2018 / 3 Vol. 33; Iss. 3

Impact of High-Temperature Storage Stressing (HTSS) on Degradation of High-Voltage 4H-SiC Junction Barrier Schottky Diodes

Yang, Shuai, Zhang, Yuming, Song, Qingwen, Tang, Xiaoyan, Zhang, Yimeng, Yuan, Lei, Zhang, Yimen
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Volume:
33
Language:
english
Journal:
IEEE Transactions on Power Electronics
DOI:
10.1109/TPEL.2017.2737358
Date:
March, 2018
File:
PDF, 476 KB
english, 2018
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