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[IEEE 2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS) - San Jose, CA (2017.10.15-2017.10.18)] 2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS) - Analysis of integrated metal seal ring resonance
Jacques, Maxime, Denis, David, Bouvier, Stephane, Samani, Alireza, Mounaim, Faycal, Plant, David V.Year:
2017
Language:
english
DOI:
10.1109/epeps.2017.8329727
File:
PDF, 915 KB
english, 2017