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[IEEE 2016 International Symposium on Semiconductor Manufacturing (ISSM) - Tokyo, Japan (2016.12.12-2016.12.13)] 2016 International Symposium on Semiconductor Manufacturing (ISSM) - Layout-based test coverage verification for high-reliability devices
Nagamura, Yoshikazu, Shiozawa, Kenji, Koyama, Tom, Matsushima, Jun, Tomonaga, Kazuhiro, Hoshi, Yutaka, Nomura, Shuji, Arai, Masayuki, Iwasaki, KazuhikoYear:
2016
Language:
english
DOI:
10.1109/issm.2016.7934518
File:
PDF, 7.02 MB
english, 2016