[IEEE 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD) - Strasbourg, France (2016.10.29-2016.11.6)] 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD) - Calibration sources and techniques for large format X-ray imagers at XFEL
Castoldi, A., Guazzoni, C., Maffessanti, S., Porro, M., Schlee, S., Weidenspointner, G.Year:
2016
Language:
english
DOI:
10.1109/nssmic.2016.8069825
File:
PDF, 520 KB
english, 2016