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Sem calibration in the micrometer and submicrometer ranges by means of a periodic linear measure
Ch. P. Volk, Yu. A. Novikov, A. V. RakovVolume:
43
Language:
english
Pages:
7
DOI:
10.1007/bf02503672
Date:
April, 2000
File:
PDF, 378 KB
english, 2000