[IEEE 2017 Symposium on VLSI Circuits - Kyoto, Japan (2017.6.5-2017.6.8)] 2017 Symposium on VLSI Circuits - FMAX/VMIN and noise margin impacts of aging on domino read, static write, and retention of 8T 1R1W SRAM arrays in 22nm high-k/metal-gate tri-gate CMOS

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