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[IEEE Conference Publications Design, Automation and Test in Europe - Grenoble, France (2015.03.9-2015.03.13)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015 - FPGA Accelerated DNA Error Correction
Ramachandran, Anand, Heo, Yun, Hwu, Wen-Mei, Ma, Jian, Chen, DemingYear:
2015
Language:
english
DOI:
10.7873/DATE.2015.0983
File:
PDF, 706 KB
english, 2015