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[IEEE Conference Publications Design, Automation and Test in Europe - Grenoble, France (2015.03.9-2015.03.13)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015 - Technology-design Co-optimization of Resistive Cross-point Array for Accelerating Learning Algorithms on Chip
Chen, Pai-Yu, Kadetotad, Deepak, Xu, Zihan, Mohanty, Abinash, Lin, Binbin, Ye, Jieping, Vrudhula, Sarma, Seo, Jae-sun, Cao, Yu, Yu, ShimengYear:
2015
Language:
english
DOI:
10.7873/date.2015.0620
File:
PDF, 1.81 MB
english, 2015