Taking into Account Interelement Interference in X-Ray...

Journal of Applied Spectroscopy 2018 / 3 Vol. 85; Iss. 1

Taking into Account Interelement Interference in X-Ray Fluorescence Analysis of Thin Two-Layer Ti/V Systems

Mashin, N. I., Razuvaev, A. G., Cherniaeva, E. A., Gafarova, L. M., Ershov, A.V.
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Volume:
85
Language:
english
Journal:
Journal of Applied Spectroscopy
DOI:
10.1007/s10812-018-0617-5
Date:
March, 2018
File:
PDF, 250 KB
english, 2018
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