New methods of X-ray reflectometry of solids and solid thin...

Journal of Russian Laser Research 1999 / 03-04 Vol. 20; Iss. 2

New methods of X-ray reflectometry of solids and solid thin films

R. M. Feshchenko, I. V. Pirshin, A. G. Touryanski, A. V. Vinogradov
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Volume:
20
Language:
english
Pages:
16
DOI:
10.1007/bf02508690
Date:
March, 1999
File:
PDF, 1.11 MB
english, 1999
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