Stability of low ohmic thick-film resistors under pulsed...

Microelectronics Reliability 2018 / 05 Vol. 84

Stability of low ohmic thick-film resistors under pulsed operation

Dąbrowski, Arkadiusz, Dziedzic, Andrzej
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Volume:
84
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.03.024
Date:
May, 2018
File:
PDF, 4.44 MB
english, 2018
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