Atom-Probe Tomography – Different Analysis Tools for Three-Dimensional Atomic-Resolution Data
Ulfig, Robert M., Larson, David J., Reinhard, David A., Kelly, Thomas F.Volume:
16
Language:
english
Journal:
Microscopy Today
DOI:
10.1017/S1551929500062301
Date:
November, 2008
File:
PDF, 1.02 MB
english, 2008