[IEEE 2017 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) - Miami, FL (2017.10.19-2017.10.21)] 2017 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) - Predicting hard failures and maximum usable range of sige HBTs
Martinez, Rafael Perez, Raghunathan, Uppili S., Wier, Brian R., Omprakash, Anup P., Oakley, Michael A., Fleetwood, Zachary E., Cressler, John D.Year:
2017
Language:
english
DOI:
10.1109/BCTM.2017.8112925
File:
PDF, 220 KB
english, 2017