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[IEEE 2018 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - Moscow (2018.1.29-2018.2.1)] 2018 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - Highly reliable SEE hardened clock gating cells

Fateev, Ivan, Timoshenkov, Valeri
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Year:
2018
Language:
english
DOI:
10.1109/EIConRus.2018.8317348
File:
PDF, 224 KB
english, 2018
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