[IEEE 2017 13th IEEE International Conference on Electronic...

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[IEEE 2017 13th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) - Yangzhou (2017.10.20-2017.10.22)] 2017 13th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) - Calibration interval optimization and calibration conclusion risk analysis on automatic test system

Jinzhe, Xie, Jiulong, Xiong
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Year:
2017
Language:
english
DOI:
10.1109/ICEMI.2017.8265776
File:
PDF, 243 KB
english, 2017
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