[IEEE 2017 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2017.4.2-2017.4.6)] 2017 IEEE International Reliability Physics Symposium (IRPS) - Error recovery of low resistance state in 40nm TaOx-based ReRAM
Maeda, Kazuki, Fukuyama, Shouhei, Takeuchi, Ken, Yasuhara, Ryutaro, Mishima, SatoshiYear:
2017
Language:
english
DOI:
10.1109/IRPS.2017.7936321
File:
PDF, 531 KB
english, 2017