![](/img/cover-not-exists.png)
[IEEE 2017 Eighteenth International Vacuum Electronics Conference (IVEC) - London (2017.4.24-2017.4.26)] 2017 Eighteenth International Vacuum Electronics Conference (IVEC) - Accelerated life test method for storage vacuum electron device based on pressurization
Yuan, Huiyu, Zhang, Jin, Shen, Changsheng, Bail, Ningfeng, Fan, Hehong, Zhao, Xingqun, Sun, Xiaohan, Zhou, Jun, Sheng, Xing, Yuan, HuiyuYear:
2017
Language:
english
DOI:
10.1109/IVEC.2017.8289641
File:
PDF, 329 KB
english, 2017