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[IEEE 2017 IEEE/MTT-S International Microwave Symposium - IMS 2017 - Honololu, HI, USA (2017.6.4-2017.6.9)] 2017 IEEE MTT-S International Microwave Symposium (IMS) - Obstacle-free particle measurement with a bistatic CW-radar
Reinhardt, Alwin, Teplyuk, Alexander, Bruns, Hendrik, Hoft, Michael, Klinkenbusch, LudgerYear:
2017
Language:
english
DOI:
10.1109/MWSYM.2017.8058636
File:
PDF, 406 KB
english, 2017