[IEEE 2016 IEEE Nuclear Science Symposium, Medical Imaging...

[IEEE 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD) - Strasbourg, France (2016.10.29-2016.11.6)] 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD) - Comparison of the radiation hardness of silicon Mach-Zehnder modulators for different DC bias voltages

Zeiler, Marcel, Detraz, Stephane, Olantera, Lauri, Sigaud, Christophe, Soos, Csaba, Troska, Jan, Vasey, Francois

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Year:

2016

Language:

english

DOI:

10.1109/NSSMIC.2016.8069867

File:

PDF, 147 KB

english, 2016

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