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Band-Edge Work Function Obtained by Plasma Doping TiN Metal Gate for nMOS Device Application
Xu, Qiuxia, Zou, Wei, Xu, Gaobo, Tang, Shan, Tao, Guilong, Salimian, Siamak, Liu, Jinbiao, Liang, Qingqing, Wang, Yao, Xiang, Jinjuan, Wang, Xiaolei, Zhu, Huilong, Li, Junfeng, Zhao, Chao, Raj, Deven,Year:
2018
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2018.2823337
File:
PDF, 1.27 MB
english, 2018