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[IEEE 2017 International Conference on Noise and Fluctuations (ICNF) - Vilnius, Lithuania (2017.6.20-2017.6.23)] 2017 International Conference on Noise and Fluctuations (ICNF) - Variability of Low Frequency Noise and mismatch in CORNER DOPED and standard CMOS technology
Coustans, Mathieu, Jazaeri, Farzan, Enz, Christian, Krummenacher, Francois, Kayal, Maher, Meyer, Rene, Acovic, Alexandre, Habas, Predrag, Lolivier, Jerome, Bucher, MatthiasYear:
2017
Language:
english
DOI:
10.1109/icnf.2017.7985953
File:
PDF, 1.56 MB
english, 2017