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[IEEE 2017 IEEE MTT-S International Microwave Symposium (IMS) - Honololu, HI (2017.6.4-2017.6.9)] 2017 IEEE MTT-S International Microwave Symposium (IMS) - A tunable reflection-mode N-path filter using 45-nm SOI CMOS
Bonner-Stewart, Jeffrey, Wilson, Charley, Floyd, BrianYear:
2017
Language:
english
DOI:
10.1109/mwsym.2017.8058961
File:
PDF, 673 KB
english, 2017