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[IEEE 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD) - Strasbourg, France (2016.10.29-2016.11.6)] 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD) - Development of a fast framing detector for electron microscopy
Johnson, Ian J., Bustillo, Karen C., Ciston, Jim, Dart, Eli, Draney, Brent R., Ercius, Peter, Fong, Erin, Grace, Carl R., Joseph, John M., Lee, Jason R., Minor, Andrew M., Ophus, Colin, Skinner, DavidYear:
2016
Language:
english
DOI:
10.1109/nssmic.2016.8069681
File:
PDF, 291 KB
english, 2016