Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
2018 / 1 Vol. 12; Iss. 1
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Analysis of the Three-Dimensional Model of Diffusion of Minority Charge Carriers Generated by an Electron Probe in a Heterogeneous Semiconductor Material by Means of Projection Methods
Seregina, E. V., Stepovich, M. A., Makarenkov, A. M.Volume:
12
Language:
english
Journal:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
DOI:
10.1134/S1027451018010160
Date:
January, 2018
File:
PDF, 657 KB
english, 2018