![](/img/cover-not-exists.png)
Atomic-Force Microscopy Probe-Activated Morphological Transformations in a Nanophase Copper Wetting Layer on Silicon
Plusnin, N. I., Maslov, A. M.Volume:
44
Language:
english
Journal:
Technical Physics Letters
DOI:
10.1134/S1063785018030094
Date:
March, 2018
File:
PDF, 681 KB
english, 2018