European Microscopy Congress 2016: Proceedings || Random Beam Scanning Transmission Electron Microscopy and Compressive Sensing as Tools for Drastic Electron Dose Reduction in Electron Tomography
Trepout, SylvainYear:
2016
DOI:
10.1002/9783527808465.EMC2016.6946
File:
PDF, 590 KB
2016