Detailed X-ray diffraction analysis of Ce 1-x Nd x O...

Journal of Nuclear Materials 2018 / 08 Vol. 507

Detailed X-ray diffraction analysis of Ce 1-x Nd x O 2-(x/2) as a surrogate for substoichiometric americium oxide

Watkinson, E.J., Chateigner, D., Ambrosi, R.M., Gascoin, S., Williams, H.R., Stephenson, K.
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Volume:
507
Language:
english
Journal:
Journal of Nuclear Materials
DOI:
10.1016/j.jnucmat.2018.05.003
Date:
August, 2018
File:
PDF, 767 KB
english, 2018
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