Simple method for significant improvement of...

Materials Science in Semiconductor Processing 2018 / 03 Vol. 76

Simple method for significant improvement of minority-carrier lifetime of evaporated BaSi 2 thin film by sputtered-AlO x passivation

Shaalan, N.M., Hara, K.O., Trinh, C.T., Nakagawa, Y., Usami, N.
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Volume:
76
Language:
english
Journal:
Materials Science in Semiconductor Processing
DOI:
10.1016/j.mssp.2017.12.015
Date:
March, 2018
File:
PDF, 659 KB
english, 2018
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