An Efficiency-Decay Model for Lumen Maintenance

IEEE Transactions on Device and Materials Reliability 2016 / 9 Vol. 16; Iss. 3

An Efficiency-Decay Model for Lumen Maintenance

Bobashev, Georgiy, Baldasaro, Nicholas G., Mills, Karmann C., Davis, J. Lynn
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Volume:
16
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2016.2584926
Date:
September, 2016
File:
PDF, 368 KB
english, 2016
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