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Homogeneity study of a GaAs:Cr pixelated sensor by means of X-rays
Billoud, T., Leroy, C., Papadatos, C., Pichotka, M., Pospisil, S., Roux, J.S.Volume:
13
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/13/04/P04002
Date:
April, 2018
File:
PDF, 1.81 MB
english, 2018