[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA, USA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - Characterization and physical modeling of the temporal evolution of near-interfacial states resulting from NBTI/PBTI stress in nMOS/pMOS transistors

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