Microwave reflectivity from 4H-SiC under a high-injection condition: impacts of electron–hole scattering
Kato, Masashi, Mori, Yuto, Ichimura, MasayaVolume:
54
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.54.04DP14
Date:
April, 2015
File:
PDF, 730 KB
english, 2015