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[IEEE 2017 IEEE Industry Applications Society Annual Meeting - Cincinnati, OH (2017.10.1-2017.10.5)] 2017 IEEE Industry Applications Society Annual Meeting - Design considerations and test setup assessment for power hardware in the loop testing
Kashani, Mahsa Ghapandar, Pulakhandam, Harish, Bhattacharya, Subhashish, Katiraei, Farid, Kaiser, DavidYear:
2017
Language:
english
DOI:
10.1109/IAS.2017.8101770
File:
PDF, 1.01 MB
english, 2017