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[IEEE 2017 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2017.12.2-2017.12.6)] 2017 IEEE International Electron Devices Meeting (IEDM) - Non-filamentary (VMCO) memory: A two-and three-dimensional study on switching and failure modes
Celano, U., Gastaldi, C., Subhechha, S., Govoreanu, B., Donadio, G., Franquet, A., Ahmad, T., Detavernier, C., Richard, O., Bender, H., Goux, L., Kar, G. S., van der Heide, P., Vandervorst, W.Year:
2017
Language:
english
DOI:
10.1109/IEDM.2017.8268519
File:
PDF, 818 KB
english, 2017