Local Whole-Device Scanning of Distortion in...

IEEE Transactions on Appiled Superconductivity 2018 / 6 Vol. 28; Iss. 4

Local Whole-Device Scanning of Distortion in Superconducting Microwave Resonators

Remillard, Stephen K., Wormmeester, Anna E., Huizen, Richard A.
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Volume:
28
Language:
english
Journal:
IEEE Transactions on Applied Superconductivity
DOI:
10.1109/TASC.2018.2803124
Date:
June, 2018
File:
PDF, 428 KB
english, 2018
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