[IEEE 2017 IEEE International Ultrasonics Symposium (IUS) - Washington, DC, USA (2017.9.6-2017.9.9)] 2017 IEEE International Ultrasonics Symposium (IUS) - SAW RFID with enhanced penetration depth
Zhao, Xupeng, Shi, Ruchuan, Qin, Peng, Ji, Xiaojun, Ma, Yixin, Wen, Yumei, Li, Ping, Han, TaoYear:
2017
Language:
english
DOI:
10.1109/ULTSYM.2017.8092838
File:
PDF, 54 KB
english, 2017