[IEEE 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Hangzhou, China (2016.10.25-2016.10.28)] 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Punch-through reading mechanism and body raised up structure for a novel Punch-Through DRAM
Chih-Chia Lin,, Jyi-Tsong Lin,, Wei-Han Lee,, Chih-Kai Huang,, Ting-Chung Chang,, Kranti, AbhinavYear:
2016
Language:
english
DOI:
10.1109/icsict.2016.7999064
File:
PDF, 766 KB
english, 2016