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[IEEE 1973 1EEE International Electromagnetic Compatibility Symposium Record - New York City, New York, USA (1973.6.20-1973.6.22)] 1973 1EEE International Electromagnetic Compatibility Symposium Record - New Methods of EED RF Testing
Joppa, Richard M., Freyman, Robert W.Year:
1973
Language:
english
DOI:
10.1109/isemc.1973.7569850
File:
PDF, 998 KB
english, 1973