[IEEE 2017 IEEE 17th International Conference on Nanotechnology (IEEE-NANO) - Pittsburgh, PA, USA (2017.7.25-2017.7.28)] 2017 IEEE 17th International Conference on Nanotechnology (IEEE-NANO) - Development and characterization of nanoparticles as imaging probes for correlative optical and electron microscopy
Thapa-Chetri, Prem S., Santiago-Robles, Carolina M., Martinez-Rivera, Noraida, Torres-Vazquez, Irma I., Joshi, Vishwas N., Powell, Richard D., Rosa-Molinar, EduardoYear:
2017
Language:
english
DOI:
10.1109/nano.2017.8117452
File:
PDF, 1.66 MB
english, 2017