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[IEEE 2017 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - Shanghai, China (2017.8.7-2017.8.11)] 2017 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - Effect of liquid on the magnetic force microscope imaging
Liu, Jinyun, Song, Zhengxun, Wang, Zuobin, Qiu, Renxi, Li, DayouYear:
2017
Language:
english
DOI:
10.1109/3M-NANO.2017.8286332
File:
PDF, 507 KB
english, 2017