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[IEEE 2017 IEEE AUTOTESTCON - Schaumburg, IL, USA (2017.9.9-2017.9.15)] 2017 IEEE AUTOTESTCON - Embedded instrumentation toolbox for screening marginal defects and outliers for production
Odintsov, Sergei, Jutman, Artur, Devadze, Sergei, Aleksejev, IgorYear:
2017
Language:
english
DOI:
10.1109/AUTEST.2017.8080516
File:
PDF, 1.35 MB
english, 2017