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[IEEE 2017 Devices for Integrated Circuit (DevIC) - Kalyani, India (2017.3.23-2017.3.24)] 2017 Devices for Integrated Circuit (DevIC) - Analog/RF performance comparison of underlap gate stack DG NMOSFETs in sub 65nm regime
Pandit, Payel, Rakshit, Nirmalya, Chakraborty, Soumadeep, Dutta, Mainak, Kundu, AtanuYear:
2017
Language:
english
DOI:
10.1109/DEVIC.2017.8074020
File:
PDF, 970 KB
english, 2017