![](/img/cover-not-exists.png)
[IEEE 2018 IEEE International Conference on Industrial Technology (ICIT) - Lyon (2018.2.20-2018.2.22)] 2018 IEEE International Conference on Industrial Technology (ICIT) - Robustness study of 1700 V 45 mΩ SiC MOSFETs
Molin, Quentin, Kanoun, Mehdi, Raynaud, Christophe, Morel, HerveYear:
2018
Language:
english
DOI:
10.1109/ICIT.2018.8352285
File:
PDF, 541 KB
english, 2018