[IEEE 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Chengdu, China (2017.7.4-2017.7.7)] 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Laser voltage imaging and probing, efficient techniques for scan chain verification in advanced node
Liu, Shih Yuan, Chou, Hsin Hung, Pang, Man Ting, Chao, Kuang Yuan, Chang, James C. C., Lin, Jian Chang, Chen, Chun MingYear:
2017
Language:
english
DOI:
10.1109/IPFA.2017.8060094
File:
PDF, 874 KB
english, 2017