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[IEEE 2017 IEEE International Conference on Imaging Systems and Techniques (IST) - Beijing, China (2017.10.18-2017.10.20)] 2017 IEEE International Conference on Imaging Systems and Techniques (IST) - Imaging and detection of cracks based on a multi-frequency electromagnetic scanning instrument and SVM
Yin, Liyuan, Wu, Jiande, Ye, Bo, Avila, Jorge Salas, Xu, Hanyang, How, Kin Yau, Tao, Yang, Yin, WuliangYear:
2017
Language:
english
DOI:
10.1109/IST.2017.8261512
File:
PDF, 556 KB
english, 2017