An Optimized Test During Burn-In for Automotive SoC

IEEE Design and Test 2018 / 6 Vol. 35; Iss. 3

An Optimized Test During Burn-In for Automotive SoC

Appello, Davide, Bugeja, Conrad, Pollaccia, Giorgio, Bernardi, Paolo, Cantoro, Riccardo, Restifo, Marco, Sanchez, Ernesto, Venini, Federico
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Volume:
35
Language:
english
Journal:
IEEE Design & Test
DOI:
10.1109/MDAT.2018.2799807
Date:
June, 2018
File:
PDF, 767 KB
english, 2018
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