[IEEE 2017 IEEE/MTT-S International Microwave Symposium - IMS 2017 - Honololu, HI, USA (2017.6.4-2017.6.9)] 2017 IEEE MTT-S International Microwave Symposium (IMS) - Full-duplex channel measurement and analysis based on high dynamic channel sounding system
Wen, Zhu, Zhong, Zhimeng, Kong, HongweiYear:
2017
Language:
english
DOI:
10.1109/MWSYM.2017.8058806
File:
PDF, 565 KB
english, 2017