[IEEE 2017 IEEE 67th Electronic Components and Technology Conference (ECTC) - Orlando, FL, USA (2017.5.30-2017.6.2)] 2017 IEEE 67th Electronic Components and Technology Conference (ECTC) - Condition Monitoring Algorithm for Piezoresistive Silicon-Based Stress Sensor Data Obtained from Electronic Control Units
Prisacaru, Alexandru, Palczynska, Alicja, Gromala, Przemyslaw Jakub, Han, Bongtae, Zhang, Guo QiYear:
2017
Language:
english
DOI:
10.1109/ectc.2017.73
File:
PDF, 1.81 MB
english, 2017